| DATE: | 1/3/2008 | RECIPE: | NITRIDE.001 | Operator | Gordon | ||||
| TUBE #: | T1 | FILE: | |||||||
| Process: | Stochiometric SILICON NITRIDE | ||||||||
| TEMPL: | 725 | DEP TIME | 30 | min | |||||
| TEMPC: | 730 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | ||
| TEMPS: | 735 | FLOW | 25 | FLOW | 75 | ||||
| WAFER: | 4" SILICON | ||||||||
| SIZE | 100mm | Substrate: | 100 | ||||||
| LOAD | 25 | Comment: | Presssure control malfunction | ||||||
| POSITION | CENTER | TOP | LEFT | BOTTOM | RIGHT | Mean Avg | S1 Dev | + or - % | HI-LO% |
| 5 | 258 | 255 | 263 | 268 | 267 | 262.2 | 5.63 | 2.15 | 2.48 |
| 13 | 253 | 249 | 258 | 263 | 257 | 256.0 | 5.29 | 2.07 | 2.73 |
| 20 | 249 | 245 | 254 | 261 | 256 | 253.0 | 6.20 | 2.45 | 3.16 |
| Wafer to | Wafer | 254.5 | 5.66 | 2.22 | 3.54 | ||||
| Dep Rate: | 8.48 | A/min | |||||||