| DATE: | 8/24/2005 | RECIPE: | LSNIT.001 | Operator | Gordon | |||||
| TUBE #: | T1 | FILE: | ||||||||
| Process: | LOW STRESS SILICON NITRIDE | |||||||||
| TEMPL: | 835 | DEP TIME | 30 | min | ||||||
| TEMPC: | 835 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | |||
| TEMPS: | 835 | FLOW | 100 | FLOW | 20 | |||||
| WAFER: | 4" SILICON | |||||||||
| SIZE | 100mm | Substrate: | 100 | |||||||
| LOAD | 25 | Comment | Refractive index = 2.19 | |||||||
| POSITION | 1CENTER | 2TOP | 3BOTTOM | 4RIGHT | 5LEFT | Mean Avg | S1 Dev | + or - % | HI-LO% | |
| 5 | 1336 | 1471 | 1350 | 1406 | 1440 | 1400.6 | 57.60 | 4.11 | 4.82 | |
| 20 | 1189 | 1340 | 1207 | 1244 | 1306 | 1257.2 | 64.39 | 5.12 | 6.01 | |
|
Wafer to | Wafer | 1328.9 | 95.02 | 7.15 | 10.61 | ||||
| Dep Rate: | 44.30 | A/min | ||||||||