| DATE: | 7/14/2005 | RECIPE: | LSNIT.001 | Operator | Gordon | |||||
| TUBE #: | T1 | FILE: | ||||||||
| Process: | LOW STRESS SILICON NITRIDE | |||||||||
| TEMPL: | 835 | DEP TIME | 30 | min | ||||||
| TEMPC: | 835 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | |||
| TEMPS: | 835 | FLOW | 100 | FLOW | 20 | |||||
| WAFER: | 4" SILICON | |||||||||
| SIZE | 100mm | Substrate: | 100 | |||||||
| LOAD | 25 | Comment | Refractive index = 2.19 | |||||||
| POSITION | 1CENTER | 2TOP | 3BOTTOM | 4RIGHT | 5LEFT | Mean Avg | S1 Dev | + or - % | HI-LO% | |
| 5 | 1255 | 1356 | 1256 | 1311 | 1321 | 1299.8 | 43.76 | 3.37 | 3.89 | |
| 20 | 1141 | 1218 | 1148 | 1202 | 1202 | 1182.2 | 35.12 | 2.97 | 3.26 | |
|
Wafer to | Wafer | 1241.0 | 72.39 | 5.83 | 8.66 | ||||
| Dep Rate: | 41.37 | A/min | ||||||||