| DATE: | 7/6/2005 | RECIPE: | LSNIT.001 | Operator | Gordon | |||||
| TUBE #: | T1 | FILE: | ||||||||
| Process: | LOW STRESS SILICON NITRIDE | |||||||||
| TEMPL: | 835 | DEP TIME | 30 | min | ||||||
| TEMPC: | 835 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | |||
| TEMPS: | 835 | FLOW | 100 | FLOW | 20 | |||||
| WAFER: | 4" SILICON | |||||||||
| SIZE | 100mm | Substrate: | 100 | |||||||
| LOAD | 25 | Comment | Refractive index = 2.18 | |||||||
| POSITION | 1CENTER | 2TOP | 3BOTTOM | 4RIGHT | 5LEFT | Mean Avg | S1 Dev | + or - % | HI-LO% | |
| 5 | 1291 | 1438 | 1306 | 1380 | 1401 | 1363.2 | 62.83 | 4.61 | 5.39 | |
| 20 | 1160 | 1277 | 1171 | 1244 | 1252 | 1220.8 | 52.07 | 4.27 | 4.79 | |
|
Wafer to | Wafer | 1292.0 | 92.70 | 7.17 | 10.76 | ||||
| Dep Rate: | 43.07 | A/min | ||||||||