| DATE: | 6/15/2005 | RECIPE: | LSNIT.001 | Operator | Gordon | |||||
| TUBE #: | T1 | FILE: | ||||||||
| Process: | LOW STRESS SILICON NITRIDE | |||||||||
| TEMPL: | 835 | DEP TIME | 30 | min | ||||||
| TEMPC: | 835 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | |||
| TEMPS: | 835 | FLOW | 100 | FLOW | 20 | |||||
| WAFER: | 4" SILICON | |||||||||
| SIZE | 100mm | Substrate: | 100 | |||||||
| LOAD | 25 | Comment | Refractive index = 2.18 | |||||||
| POSITION | 1CENTER | 2TOP | 3BOTTOM | 4RIGHT | 5LEFT | Mean Avg | S1 Dev | + or - % | HI-LO% | |
| 5 | 1148 | 1149 | 1200 | 1176 | 1182 | 1171.0 | 22.36 | 1.91 | 2.22 | |
| 20 | 1082 | 1092 | 1133 | 1124 | 1122 | 1110.6 | 22.22 | 2.00 | 2.30 | |
|
Wafer to | Wafer | 1140.8 | 38.15 | 3.34 | 5.17 | ||||
| Dep Rate: | 38.03 | A/min | ||||||||