| DATE: | 6/8/2005 | RECIPE: | LSNIT.001 | Operator | Henry | |||||
| TUBE #: | T1 | FILE: | ||||||||
| Process: | LOW STRESS SILICON NITRIDE | |||||||||
| TEMPL: | 835 | DEP TIME | 30 | min | ||||||
| TEMPC: | 835 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | |||
| TEMPS: | 835 | FLOW | 100 | FLOW | 20 | |||||
| WAFER: | 4" SILICON | |||||||||
| SIZE | 100mm | Substrate: | 100 | |||||||
| LOAD | 25 | Comment | Refractive index = 2.18 | |||||||
| POSITION | 1CENTER | 2TOP | 3BOTTOM | 4RIGHT | 5LEFT | Mean Avg | S1 Dev | + or - % | HI-LO% | |
| 5 | 1220 | 1231 | 1337 | 1296 | 1292 | 1275.2 | 48.82 | 3.83 | 4.59 | |
| 20 | 1130 | 1143 | 1205 | 1185 | 1168 | 1166.2 | 30.46 | 2.61 | 3.22 | |
|
Wafer to | Wafer | 1220.7 | 69.08 | 5.66 | 8.48 | ||||
| Dep Rate: | 40.69 | A/min | ||||||||