| DATE: | 6/8/2005 | RECIPE: | LSNIT.001 | Operator | Henry | |||||
| TUBE #: | T1 | FILE: | ||||||||
| Process: | LOW STRESS SILICON NITRIDE | |||||||||
| TEMPL: | 835 | DEP TIME | 30 | min | ||||||
| TEMPC: | 835 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | |||
| TEMPS: | 835 | FLOW | 100 | FLOW | 20 | |||||
| WAFER: | 4" SILICON | |||||||||
| SIZE | 100mm | Substrate: | 100 | |||||||
| LOAD | 25 | Comment | Refractive index = 2.09 | |||||||
| POSITION | 1CENTER | 2TOP | 3BOTTOM | 4RIGHT | 5LEFT | Mean Avg | S1 Dev | + or - % | HI-LO% | |
| 5 | 1140 | 1150 | 1220 | 1200 | 1260 | 1194.0 | 49.80 | 4.17 | 5.03 | |
| 20 | 1070 | 1080 | 1140 | 1120 | 1120 | 1106.0 | 29.66 | 2.68 | 3.16 | |
|
Wafer to | Wafer | 1150.0 | 60.37 | 5.25 | 8.26 | ||||
| Dep Rate: | 38.33 | A/min | ||||||||