| DATE: | 6/7/2005 | RECIPE: | LSNIT.001 | Operator | Henry | |||||
| TUBE #: | T1 | FILE: | ||||||||
| Process: | LOW STRESS SILICON NITRIDE | |||||||||
| TEMPL: | 835 | DEP TIME | 30 | min | ||||||
| TEMPC: | 835 | GAS | DCS | GAS | NH3 | PRCPR | 250 mTorr | |||
| TEMPS: | 835 | FLOW | 100 | FLOW | 20 | |||||
| WAFER: | 4" SILICON | |||||||||
| SIZE | 100mm | Substrate: | 100 | |||||||
| LOAD | 25 | Comment | Refractive index = 2.09 | |||||||
| POSITION | 1CENTER | 2TOP | 3BOTTOM | 4RIGHT | 5LEFT | Mean Avg | S1 Dev | + or - % | HI-LO% | |
| 5 | 873 | 882 | 943 | 925 | 981 | 920.8 | 44.51 | 4.83 | 5.86 | |
| 20 | 797 | 812 | 871 | 852 | 853 | 837.0 | 31.07 | 3.71 | 4.42 | |
|
Wafer to | Wafer | 878.9 | 57.10 | 6.50 | 10.47 | ||||
| Dep Rate: | 29.30 | A/min | ||||||||